Apparatus for working and observing samples and method of working and observing cross sections

Charged Particle Beam Apparatus

Method and apparatus for specimen fabrication

Method for thinning a sample and sample carrier for performing said method

Method of fabricating grabbing face of sample grabbing portion

Charged particle beam device probe operation

Ion beam system and machining method

Protective layer for charged particle beam processing

Sample preparation system

Graphical automated machine control and metrology

Method for obtaining images from slices of specimen

Planar view sample preparation

Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus

Apparatus for Preparing Cross-Sectional Specimen Using Ion Beam

Method and apparatus for processing a micro sample

Multi-part specimen holder with conductive patterns

Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods

Charge particle beam system, sample processing method, and semiconductor inspection system

Focused ION beam apparatus

Manufacturing equipment using ION beam or electron beam

Sample preparation technique

Sample preparation

Method for depositing a film using a charged particle beam, method for performing selective etching using the same, and charged particle beam equipment therefor

Method, System and Device for Microscopic Examination Employing Fib-Prepared Sample Grasping Element

Focused ion beam system and a method of sample preparation and observation

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Method for creating observational sample

Method and apparatus for processing a micro sample

Charged particle beam system, semiconductor inspection system, and method of machining sample

Method and sample for radiation microscopy including a particle beam channel formed in the sample source

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Focused ion beam apparatus for specimen fabrication

Strain detection for automated nano-manipulation

Charged particle beam apparatus

Defect analyzer

Apparatus and method for inspecting a sample of a specimen by means of an electron beam

Charged particle beam apparatus

Device and method for milling of material using ions

Methods for sample preparation and observation, charged particle apparatus

Focused ion beam system

Method of cross-section milling with focused ion beam (FIB) device

Apparatus and method for specimen fabrication

Method for preparing a sample for electron microscopic examinations, and sample supports and transport holders used therefor

Composite charged particle beam apparatus and an irradiation alignment method in it

TEM sample preparation from a circuit layer structure

Method and apparatus for specimen fabrication

Glow discharge drilling apparatus and glow discharge drilling method

TEM sample holder and method of forming same

Three-dimensional structure analyzing system

Information acquisition apparatus, cross section evaluating apparatus, cross section evaluating method, and cross section working apparatus

Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus

Charged particle beam device probe operation

Method and apparatus for specimen fabrication

Repetitive circumferential milling for sample preparation

Method of making lamina specimen

Planar view TEM sample preparation from circuit layer structures

Method and equipment for specimen preparation

Kit for preparing a tem sample holder

Apparatus for preparing a TEM sample holder

Method of preparing a sample for examination in a TEM

TEM sample holder

Charged particle beam apparatus and sample manufacturing method

Method and apparatus for the automated process of in-situ lift-out

Apparatus and method of detecting probe tip contact with a surface

Ion beam system and machining method

Device and method for milling of material using ions

Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope

Method for the removal of a microscopic sample from a substrate

Method and apparatus for rapid sample preparation in a focused ion beam microscope

Method and apparatus for sample formation and microanalysis in a vacuum chamber

Apparatus for sample formation and microanalysis in a vacuum chamber

Method for the removal of a microscopic sample from a substrate

Lift-out probe having an extension tip, methods of making and using, and analytical instruments employing same

Ion beam device and ion beam processing method, and holder member

Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Graphical automated machine control and metrology

Probe current imaging

Probe tip processing

Method, system and device for microscopic examination employing fib-prepared sample grasping element

Apparatus and method for preparing samples

Inspection by a transmission electron microscope of a sample

Method for depositing a film using a charged particle beam, method for performing selective etching using the same, and charged particle beam equipment therefor

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for processing a micro sample

Three-dimensional (3D) imaging system and method for nanostructure

Method of producing lift out specimens for teaching, practice, and training