Patents-Review.com
ClassID:

206635 ⎘

H01J2237/31745 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion beam tubes for processing objects; Processing objects on a microscale; Etching microareas for preparing specimen to be viewed in microscopes or analyzed in microanalysers

Recent Application in this class:
#1
20260112573
2026-04-23

METHOD AND APPARATUS FOR CHARGE COMPENSATION DURING 3D TOMOGRAPHY

 #2
20260058093
2026-02-26

METHOD FOR LOCALIZING A REGION OF INTEREST IN A SAMPLE AND MICROMACHINING THE SAMPLE USING A CHARGED PARTICLE BEAM

 #3
20260031300
2026-01-29

STANDARD SAMPLE FOR USE IN TRANSMISSION ELECTRON MICROSCOPE, METHOD OF PREPARING THE SAME, METHOD OF ADJUSTING TRANSMISSION ELECTRON MICROSCOPE, AND METHOD OF ANALYZING OBSERVATION IMAGE OBTAINED WITH TRANSMISSION ELECTRON MICROSCOPE

 #4
20260004992
2026-01-01

LAMELLA PREPARATION FROM THICK HPF SAMPLES

 #5
20250391636
2025-12-25

METHOD FOR PREPARING TEM SAMPLE

 #6
20250292433
2025-09-18

3D FIDUCIAL FOR PRECISION 3D NAND CHANNEL TILT/SHIFT ANALYSIS

 #7
20250198891
2025-06-19

Gas Phase Sample Preparation for Cryo-Electron Microscopy

 #8
20250149289
2025-05-08

ION MILLING DEVICE

 #9
20250095959
2025-03-20

DELAYERING APPARATUS AND METHODS

 #10
20250087453
2025-03-13

NANOSCALE FAILURE ANALYSIS METHOD

 #11
20250005714
2025-01-02

FOCUS STACKING APPLICATIONS FOR SAMPLE PREPARATION

 #12
20240404786
2024-12-05

METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INVESTIGATION DEVICE TO PERFORM SUCH METHOD

 #13
20240347312
2024-10-17

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES VIA BACKSIDE THINNING

 #14
20240321548
2024-09-26

Integrated Circuit with FIB-Ready Structures

 #15
20240266142
2024-08-08

Systems and methods for performing sample lift-out for highly reactive materials

 #16
20240234085
2024-07-11

METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION BEAM AND AN INNOVATIVE SCANNING STRATEGY

 #17
20240136150
2024-04-25

METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION BEAM AND AN INNOVATIVE SCANNING STRATEGY

 #18
20240120175
2024-04-11

METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY

 #19
20240071720
2024-02-29

METHOD AND SYSTEM FOR PREPARING A SPECIMEN

 #20
20240071717
2024-02-29

Application Management For Charged Particle Microscope Devices

 #21
20230377834
2023-11-23

Systems and methods for pre-aligning samples for more efficient processing of multiple samples with a Broad Ion Beam (BIB) system

 #22
20230358696
2023-11-09

Method for cross-section sample preparation

 #23
20230343546
2023-10-26

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES

 #24
20230307209
2023-09-28

ENDPOINTING WITH DETERMINATION OF REMAINING DISTANCE

 #25
20230298855
2023-09-21

METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED ION BEAM

 #26
20230273136
2023-08-31

SAMPLE PREPARATION METHOD AND APPARATUS

 #27
20230266214
2023-08-24

Gas phase sample preparation for cryo-electron microscopy

 #28
20230215690
2023-07-06

Systems and methods for performing sample lift-out for highly reactive materials

 #29
20230145897
2023-05-11

Method for measuring a sample and microscope implementing the method

 #30
20230073506
2023-03-09

WORKSTATION, PREPARATION STATION AND METHOD FOR MANIPULATING AN ELECTRON MICROSCOPY GRID ASSEMBLY

 #31
20230067374
2023-03-02

Analysis device, analysis method, and storage medium

 #32
20220392739
2022-12-08

Specimen Machining Device and Specimen Machining Method

 #33
20220367148
2022-11-17

Ion milling device

 #34
20220367144
2022-11-17

Method for producing lamella, analysis system and method for analyzing sample

 #35
20220317072
2022-10-06

Method for cross-section sample preparation

 #36
20220254060
2022-08-11

3D fiducial for precision 3D NAND channel tilt/shift analysis

 #37
20220068600
2022-03-03

Method for preparing a TEM sample

 #38
20220065761
2022-03-03

Gas phase sample preparation for cryo-electron microscopy

 #39
20220051870
2022-02-17

Ion milling apparatus and sample holder

 #40
20220028655
2022-01-27

Method of preparing and analyzing thin films

 #41
20210350999
2021-11-11

Imaging method and imaging system

 #42
20210151283
2021-05-20

Composite charged particle beam apparatus

 #43
20210118678
2021-04-22

Method of material deposition

 #44
20210090854
2021-03-25

Focused ion beam apparatus

 #45
20210090851
2021-03-25

Charged particle beam apparatus

 #46
20210066056
2021-03-04

Method, device and system for the treatment of biological cryogenic samples by plasma focused ion beams

 #47
20210050180
2021-02-18

A Device for Extracting and Placing a Lamella

 #48
20200312618
2020-10-01

Diagonal compound mill

 #49
20200266031
2020-08-20

Method of preparing thin film sample piece and charged particle beam apparatus

 #50
20200264115
2020-08-20

Method for cross-section sample preparation

 #51
20200158665
2020-05-21

Methods and compositions for micro-electron diffraction

 #52
20200158607
2020-05-21

Gas phase sample preparation for cryo-electron microscopy

 #53
20200126756
2020-04-23

Face-on, gas-assisted etching for plan-view lamellae preparation

 #54
20200098554
2020-03-26

Method of sample preparation using dual ion beam trenching

 #55
20200095688
2020-03-26

Dose-based end-pointing for low-kV FIB milling in TEM sample preparation

 #56
20200035453
2020-01-30

Automatic processing device

 #57
20200035444
2020-01-30

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES

 #58
20200027692
2020-01-23

Tomography-assisted TEM prep with requested intervention automation workflow

 #59
20190318908
2019-10-17

Method for producing a TEM sample

 #60
20190304744
2019-10-03

Methods for acquiring planar view stem images of device structures

 #61
20190279843
2019-09-12

Apparatus, method, and program for processing and observing cross section, and method of measuring shape

 #62
20190272975
2019-09-05

Automated TEM sample preparation

 #63
20190259569
2019-08-22

Composite charged particle beam apparatus

 #64
20190172680
2019-06-06

Endpointing for focused ion beam processing

 #65
20190164722
2019-05-30

Cross section processing observation method and charged particle beam apparatus

 #66
20190139735
2019-05-09

Tomography-assisted TEM prep with requested intervention automation workflow

 #67
20190108971
2019-04-11

Specimen preparation and inspection in a dual-beam charged particle microscope

 #68
20190103251
2019-04-04

Depth-controllable ion milling

 #69
20190088445
2019-03-21

Device with ion column and scanning electron microscope

 #70
20190057522
2019-02-21

Three-dimensional image reconstruction method

 #71
20190035599
2019-01-31

System and method for performing nano beam diffraction analysis

 #72
20190033182
2019-01-31

Sample holder, ion milling apparatus, sample processing method, sample observing method, and sample processing and observing method

 #73
20190019650
2019-01-17

Method for the in situ preparation of microscopic specimens

 #74
20190017904
2019-01-17

Probe with solid beveled tip and method for using same for specimen extraction

 #75
20190013179
2019-01-10

Device processing method and device processing apparatus

 #76
20180358201
2018-12-13

Sample holder system and sample observation apparatus

 #77
20180350558
2018-12-06

Face-on, gas-assisted etching for plan-view lamellae preparation

 #78
20180342369
2018-11-29

Ion milling apparatus and sample holder

 #79
20180301319
2018-10-18

Fiducial design for tilted or glancing mill operations with a charged particle beam

 #80
20180277361
2018-09-27

Method of material deposition

 #81
20180277336
2018-09-27

Sample holder, member mounting device, and charged particle beam apparatus

 #82
20180247793
2018-08-30

GLANCING ANGLE MILL

 #83
20180240642
2018-08-23

Method and apparatus for transmission electron microscopy

 #84
20180218878
2018-08-02

Enhanced FIB-SEM systems for large-volume 3D imaging

 #85
20180218875
2018-08-02

Innovative source assembly for ion beam production

 #86
20180204705
2018-07-19

Charged particle beam apparatus

 #87
20180204704
2018-07-19

CHARGED PARTICLE BEAM APPARATUS

 #88
20180174798
2018-06-21

Methods, apparatuses, systems and software for treatment of a specimen by ion-milling

 #89
20180143110
2018-05-24

Tomography sample preparation systems and methods with improved speed, automation, and reliability

 #90
20180019095
2018-01-18

Charged particle instruments

 #91
20180012729
2018-01-11

Apparatus with two or more particle beams for processing a specimen

 #92
20170278667
2017-09-28

Sample holder and focused ion beam apparatus

 #93
20170271122
2017-09-21

Focused ion beam apparatus

 #94
20170263416
2017-09-14

Method for structuring an object and associated particle beam system

 #95
20170256380
2017-09-07

Automated TEM sample preparation

 #96
20170250055
2017-08-31

High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella

 #97
20170200589
2017-07-13

Charged particle beam-induced etching

 #98
20170178858
2017-06-22

Charged particle beam apparatus

 #99
20170133220
2017-05-11

Method of material deposition

 #100
20170097290
2017-04-06

Method of preparing a sample for microstructure diagnostics, and sample for microstructure diagnostics

 #101
20170062178
2017-03-02

CAD-assisted TEM prep recipe creation

 #102
20170053778
2017-02-23

Method of preparing a plan-view transmission electron microscope sample used in an integrated circuit analysis

 #103
20170011885
2017-01-12

Method for preparing cross-sections by ion beam milling

 #104
20160356683
2016-12-08

Method of preparing a sample for microstructure diagnostics, and sample for microstructure diagnostics

 #105
20160307727
2016-10-20

Method of manipulating a sample in an evacuated chamber of a charged particle apparatus

 #106
20160274040
2016-09-22

Method for generating image data relating to an object and particle beam device for carrying out this method

 #107
20160233053
2016-08-11

Method for rapid switching between a high current mode and a low current mode in a charged particle beam system

 #108
20160223434
2016-08-04

Sample carrying device and vacuum apparatus

 #109
20160211113
2016-07-21

Differential imaging with pattern recognition for process automation of cross sectioning applications

 #110
20160199878
2016-07-14

Method of modifying a sample surface layer from a microscopic sample

 #111
20160181058
2016-06-23

Method for processing and/or for observing an object, and particle beam device for carrying out the method

 #112
20160163506
2016-06-09

Method for S/TEM sample analysis

 #113
20160148783
2016-05-26

Method of specimen processing in an apparatus with two or more particle beams and apparatus for this processing

 #114
20160141147
2016-05-19

Automated TEM sample preparation

 #115
20160126060
2016-05-05

Endpointing for focused ion beam processing

 #116
20160093470
2016-03-31

Chicane blanker assemblies for charged particle beam systems and methods of using the same

 #117
20160093464
2016-03-31

Composite charged particle beam apparatus

 #118
20160084742
2016-03-24

Sample stack structure and method for preparing the same

 #119
20160071687
2016-03-10

Charged particle radiation device and specimen preparation method using said device

 #120
20160064187
2016-03-03

Charged particle beam apparatus

 #121
20160054240
2016-02-25

Method of acquiring EBSP patterns

 #122
20160027612
2016-01-28

Apparatus for preparing a sample for microscopy

 #123
20160020069
2016-01-21

TEM sample preparation

 #124
20150369710
2015-12-24

Method and System of Creating a Symmetrical FIB Deposition

 #125
20150357159
2015-12-10

Fiducial design for tilted or glancing mill operations with a charged particle beam

 #126
20150348752
2015-12-03

Ion implantation to alter etch rate

 #127
20150325409
2015-11-12

TEM sample preparation

 #128
20150323429
2015-11-12

Method for creating S/TEM sample and sample structure

 #129
20150311034
2015-10-29

Method and apparatus for sample extraction and handling

 #130
20150294834
2015-10-15

High capacity TEM grid

 #131
20150276567
2015-10-01

Method and system for reducing curtaining in charged particle beam sample preparation

 #132
20150262788
2015-09-17

Cross-section processing and observation method and cross-section processing and observation apparatus

 #133
20150255250
2015-09-10

Charged particle beam device and sample preparation method

 #134
20150255248
2015-09-10

Methods, apparatuses, systems and software for treatment of a specimen by ion-milling

 #135
20150253353
2015-09-10

Fabrication of a malleable lamella for correlative atomic-resolution tomographic analyses

 #136
20150243478
2015-08-27

High aspect ratio structure analysis

 #137
20150243477
2015-08-27

Bulk deposition for tilted mill protection

 #138
20150221468
2015-08-06

Scanning electron microscope

 #139
20150214004
2015-07-30

METHOD FOR PREPARING AND ANALYZING AN OBJECT AS WELL AS PARTICLE BEAM DEVICE FOR PERFORMING THE METHOD

 #140
20150206707
2015-07-23

Method for S/TEM sample analysis

 #141
20150136977
2015-05-21

Differential imaging with pattern recognition for process automation of cross sectioning applications

 #142
20150115156
2015-04-30

Cross section processing method and cross section processing apparatus

 #143
20150114193
2015-04-30

Integrated lamellae extraction station

 #144
20150102009
2015-04-16

Method for preparing thin samples for TEM imaging

 #145
20150075972
2015-03-19

Detaching probe from TEM sample during sample preparation

 #146
20150053548
2015-02-26

TEM sample preparation

 #147
20150048248
2015-02-19

Method for processing and/or for observing an object, and particle beam device for carrying out the method

 #148
20150028225
2015-01-29

Method for manufacturing a TEM-lamella and assembly having a TEM-lamella protective structure

 #149
20150021475
2015-01-22

Automated slice milling for viewing a feature

 #150
20150008121
2015-01-08

Ion milling device

 #151
20140367571
2014-12-18

Method of welding a frozen aqueous sample to a microprobe

 #152
20140332699
2014-11-13

Ion beam sample preparation apparatus and methods

 #153
20140312226
2014-10-23

Charged-particle microscope providing depth-resolved imagery

 #154
20140302252
2014-10-09

Low energy ion milling or deposition

 #155
20140299785
2014-10-09

Method and arrangement for manufacturing a sample for microstructural materials diagnostics and corresponding sample

 #156
20140291512
2014-10-02

Focused ion beam apparatus and method of working sample using the same

 #157
20140191126
2014-07-10

Method of depositing protective structures

 #158
20140138350
2014-05-22

Method for preparing samples for imaging

 #159
20140131575
2014-05-15

Cross-section processing and observation method and cross-section processing and observation apparatus

 #160
20140116873
2014-05-01

Method for creating S/TEM sample and sample structure

 #161
20140110577
2014-04-24

Particle beam system and method of processing a TEM-sample

 #162
20140076717
2014-03-20

Charged particle beam device and sample production method

 #163
20140061502
2014-03-06

Specimen holder for holding a semiconductor device during a sample preparation procedure carried out using first and second sample preparation apparatuses

 #164
20140061159
2014-03-06

Composite charged particle beam apparatus and thin sample processing method

 #165
20140061032
2014-03-06

Dose-based end-pointing for low-kV FIB milling TEM sample preparation

 #166
20140053122
2014-02-20

METHOD FOR ADJUSTING A LAYOUT OF AN INTEGRATED CIRCUIT

 #167
20140028828
2014-01-30

Ion beam sample preparation apparatus and methods

 #168
20130341505
2013-12-26

Method for S/TEM sample analysis

 #169
20130340936
2013-12-26

Method for ex-situ lift-out specimen preparation

 #170
20130334034
2013-12-19

Ion beam device and machining method

 #171
20130328246
2013-12-12

Lamella creation method and device using fixed-angle beam and rotating sample stage

 #172
20130323937
2013-12-05

Combined laser processing system and focused ion beam system

 #173
20130319849
2013-12-05

Preparation of lamellae for TEM viewing

 #174
20130251914
2013-09-26

Sample preparation method

 #175
20130248708
2013-09-26

Cross-section processing and observation method and cross-section processing and observation apparatus

 #176
20130248707
2013-09-26

Sample observation method, sample preparation method, and charged particle beam apparatus

 #177
20130248354
2013-09-26

High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella

 #178
20130240353
2013-09-19

Ion milling device and ion milling processing method

 #179
20130214468
2013-08-22

Method and apparatus for ex-situ lift-out specimen preparation

 #180
20130214458
2013-08-22

Sample preparation method and apparatus

 #181
20130209700
2013-08-15

TEM sample preparation method

 #182
20130199034
2013-08-08

Methods and apparatuses of using metal needle arrays for specimen lift-out and circuit edit

 #183
20130186747
2013-07-25

Glancing angle mill

 #184
20130175446
2013-07-11

Method for preparing lamella

 #185
20130174301
2013-07-04

Method and apparatus for in situ preparation of serial planar surfaces for microscopy

 #186
20130153785
2013-06-20

Method and apparatus for sample extraction and handling

 #187
20130143412
2013-06-06

Methods for preparing thin samples for TEM imaging

 #188
20130105302
2013-05-02

Charged particle beam device and sample production method

 #189
20130082176
2013-04-04

Composite charged particle beam apparatus

 #190
20130081882
2013-04-04

METHOD OF CHARACTERIZING A MATERIAL USING THREE DIMENSIONAL RECONSTRUCTION OF SPATIALLY REFERENCED CHARACTERISTICS AND USE OF SUCH INFORMATION

 #191
20130075606
2013-03-28

Composite charged particle beam apparatus

 #192
20130037713
2013-02-14

Method for processing samples held by a nanomanipulator

 #193
20130037706
2013-02-14

Devices and methods for cryo lift-out with in situ probe

 #194
20130032714
2013-02-07

Apparatus and method for probe shape processing by ion beam

 #195
20130001420
2013-01-03

Composite charged-particle-beam apparatus

 #196
20130001191
2013-01-03

REDEPOSITION TECHNIQUE FOR MEMBRANE ATTACHMENT

 #197
20120326028
2012-12-27

Charged particle beam apparatus, and sample processing and observation method

 #198
20120305765
2012-12-06

Particle beam device and method for use in a particle beam device

 #199
20120293791
2012-11-22

Sample Holder with Optical Features for Holding a Sample in an Analytical Device for Research Purposes

 #200
20120292507
2012-11-22

Charged particle beam device and sample observation method

 #201
20120286149
2012-11-15

METHOD AND APPARATUS FOR PROVIDING BEAMS OF NANODROPLETS FOR HIGH SPUTTERING RATE OF INERT MATERIALS

 #202
20120273692
2012-11-01

Method and apparatus for processing a micro sample

 #203
20120235055
2012-09-20

Focused ion beam device and focused ion beam processing method

 #204
20120217152
2012-08-30

Method for rapid switching between a high current mode and a low current mode in a charged particle beam system

 #205
20120199737
2012-08-09

Sample preparation

 #206
20120189813
2012-07-26

TEM-lamella, process for its manufacture, and apparatus for executing the process

 #207
20120187291
2012-07-26

Method of Depositing Protective Structures

 #208
20120187285
2012-07-26

Measurement and endpointing of sample thickness

 #209
20120152731
2012-06-21

Method for creating S/TEM sample and sample structure

 #210
20120145897
2012-06-14

Sample holder with optical features

 #211
20120119084
2012-05-17

Method and apparatus for rapid preparation of multiple specimens for transmission electron microscopy

 #212
20120112064
2012-05-10

Sample holder, method for use of the sample holder, and charged particle device

 #213
20120107521
2012-05-03

Protective layer for charged particle beam processing

 #214
20120103938
2012-05-03

Method and system for milling and imaging an object

 #215
20120085924
2012-04-12

Method and apparatus for specimen fabrication

 #216
20120085906
2012-04-12

Cross-section systems and methods

 #217
20120067718
2012-03-22

METHOD AND APPARATUS FOR PRODUCING THREE DIMENSIONAL NANO AND MICRO SCALE STRUCTURES

 #218
20120043463
2012-02-23

Composite charged particle beams apparatus

 #219
20120001086
2012-01-05

Charged particle beam apparatus and sample processing method

 #220
20110297826
2011-12-08

Charged particle beam device and method for correcting position with respect to charged particle beam

 #221
20110290639
2011-12-01

METHOD AND APPARATUS FOR PROVIDING BEAMS OF NANODROPLETS FOR HIGH SPUTTERING RATE OF INERT MATERIALS

 #222
20110251713
2011-10-13

Defect analyzer

 #223
20110240852
2011-10-06

Automated slice milling for viewing a feature

 #224
20110226948
2011-09-22

Sample processing and observing method

 #225
20110226947
2011-09-22

Composite charged particle beam apparatus and sample processing and observing method

 #226
20110226819
2011-09-22

Method for obtaining images from slices of specimen

 #227
20110204226
2011-08-25

APPARATUS FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRUMENT

 #228
20110204225
2011-08-25

ION Beam System and Machining Method

 #229
20110174974
2011-07-21

Method and apparatus for processing a microsample

 #230
20110151597
2011-06-23

Analysis method for semiconductor device

 #231
20110140006
2011-06-16

Method and apparatus for specimen fabrication

 #232
20110114476
2011-05-19

Method and apparatus for specimen fabrication

 #233
20110031397
2011-02-10

Method for stem sample inspection in a charged particle beam instrument

 #234
20110031396
2011-02-10

Method for stem sample inspection in a charged particle beam instrument

 #235
20110027486
2011-02-03

Method for preparing transmission electron microscope sample

 #236
20110017927
2011-01-27

Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument

 #237
20110017922
2011-01-27

VARIABLE-TILT TEM SPECIMEN HOLDER FOR CHARGED-PARTICLE BEAM INSTRUMENTS

 #238
20110011190
2011-01-20

Probe and method for obtaining three-dimensional compositional maps of a biological sample

 #239
20110006207
2011-01-13

Method for S/TEM sample analysis

 #240
20100327180
2010-12-30

Beam quality in FIB systems

 #241
20100308219
2010-12-09

Method for creating S/TEM sample and sample structure

 #242
20100305747
2010-12-02

Method and apparatus for sample extraction and handling

 #243
20100300873
2010-12-02

Method for creating S/tem sample and sample structure

 #244
20100288924
2010-11-18

Composite focused ion beam device, process observation method using the same, and processing method

 #245
20100276607
2010-11-04

Method of depositing protective structures

 #246
20100243889
2010-09-30

Forming an image while milling a work piece

 #247
20100215868
2010-08-26

Micro cross-section processing method

 #248
20100189917
2010-07-29

Cross section processing method and method of manufacturing cross section observation sample

 #249
20100176296
2010-07-15

Composite focused ion beam device, and processing observation method and processing method using the same

 #250
20100163752
2010-07-01

Method of processing objects by focused ion beam system and carrier used therewith

 #251
20100155624
2010-06-24

Focused ion beam apparatus, sample processing method using the same, and computer program for focused ion beam processing

 #252
20100138028
2010-06-03

Graphical automated machine control and metrology

 #253
20100136255
2010-06-03

ICE LAYERS IN CHARGED PARTICLE SYSTEMS AND METHODS

 #254
20100133432
2010-06-03

Charged particle beam analysis while part of a sample to be analyzed remains in a generated opening of the sample

 #255
20100116977
2010-05-13

Measurement and endpointing of sample thickness

 #256
20100102248
2010-04-29

Transmission electron microscope sample holder with optical features

 #257
20100090108
2010-04-15

Method and apparatus for producing samples for transmission electron microscopy

 #258
20100084555
2010-04-08

Preparation method for an electron tomography sample with embedded markers and a method for reconstructing a three-dimensional image

 #259
20100072400
2010-03-25

METHOD FOR CLEANING A HIGH RESOLUTION SCANNING ELECTRON MICROSCOPE SAMPLE WITH A LOW POWER ION BEAM

 #260
20100059672
2010-03-11

Device and method for analyzing a sample

 #261
20100032567
2010-02-11

Method of machining a work piece with a focused particle beam

 #262
20100032302
2010-02-11

Method to direct pattern metals on a substrate

 #263
20100025580
2010-02-04

GRID HOLDER FOR STEM ANALYSIS IN A CHARGED PARTICLE INSTRUMENT

 #264
20100025577
2010-02-04

Method for the production of a sample for electron microscopy

 #265
20100008563
2010-01-14

Section processing method and its apparatus

 #266
20090323287
2009-12-31

Integrated Circuit Cooling Apparatus for Focused Beam Processes

 #267
20090320624
2009-12-31

Method for preparing specimens for atom probe analysis and specimen assemblies made thereby

 #268
20090309025
2009-12-17

Particle optical arrangement

 #269
20090296073
2009-12-03

Method to create three-dimensional images of semiconductor structures using a focused ion beam device and a scanning electron microscope

 #270
20090294690
2009-12-03

Method of forming TEM sample holder

 #271
20090256081
2009-10-15

Focused ion beam apparatus

 #272
20090242759
2009-10-01

Slice and view with decoration

 #273
20090230303
2009-09-17

Defect analyzer

 #274
20090230299
2009-09-17

Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample

 #275
20090206254
2009-08-20

Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same

 #276
20090135240
2009-05-28

System and method for focused ion beam data analysis

 #277
20090127458
2009-05-21

Methods for sample preparation and observation, charged particle apparatus

 #278
20090126051
2009-05-14

Method for sample preparation

 #279
20090121158
2009-05-14

Apparatus and method for specimen fabrication

 #280
20090119807
2009-05-07

Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscope

 #281
20090114842
2009-05-07

Sample preparing device and sample posture shifting method

 #282
20090078867
2009-03-26

Method and system for generating and reviewing a thin sample

 #283
20090078060
2009-03-26

Method and apparatus for transfer of samples in a controlled environment

 #284
20090071605
2009-03-19

Method for depositing a film using a charged particle beam, method for performing selective etching using the same, and charged particle beam equipment therefor

 #285
20090039260
2009-02-12

Charged particle beam apparatus

 #286
20090020698
2009-01-22

CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVATION METHOD

 #287
20090014648
2009-01-15

Particle beam device and method for use in a particle beam device

 #288
20090008578
2009-01-08

Method and apparatus for specimen fabrication

 #289
20090000400
2009-01-01

Method for attaching a sample to a manipulator by melting and then freezing part of said sample

 #290
20080315130
2008-12-25

Focused ion beam processing system and method

 #291
20080315088
2008-12-25

Composite charged-particle beam system

 #292
20080296516
2008-12-04

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

 #293
20080296498
2008-12-04

In-situ STEM sample preparation

 #294
20080296497
2008-12-04

Method and apparatus for specimen fabrication

 #295
20080290291
2008-11-27

Charged particle beam processing apparatus

 #296
20080290290
2008-11-27

Heating stage for a micro-sample

 #297
20080264905
2008-10-30

Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis

 #298
20080258060
2008-10-23

Charged particle beam apparatus and method for operating a charged particle beam apparatus

 #299
20080258056
2008-10-23

Method for STEM sample inspection in a charged particle beam instrument

 #300
20080245965
2008-10-09

Charged particle system