ClassID:

206661

H01J2237/31789 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion beam tubes for processing objects; Processing objects on a microscale; Lithography by projection Reflection mask

Recent Application in this class:
#1
20160233054
2016-08-11

Self-aligned dynamic pattern generator device and method of fabrication

#2
20160225612
2016-08-04

Bonding pad surface damage reduction in a formation of digital pattern generator

#3
20160172151
2016-06-16

Apparatus and methods for aberration correction in electron beam based system

#4
20160148784
2016-05-26

Dynamic pattern generator and method of toggling mirror cells of the dynamic pattern generator

#5
20150179403
2015-06-25

Method and apparatus for transferring pixel data for electron beam lithography

#6
20150179392
2015-06-25

Method and apparatus for electron beam lithography

#7
20150160568
2015-06-11

Mirror array in digital pattern generator (DPG)

#8
20140272712
2014-09-18

E-beam lithography with alignment gating

#9
20140268076
2014-09-18

Self-aligned dynamic pattern generator device and method of fabrication

#10
20140212815
2014-07-31

Charged particle lithography system with a long shape illumination beam

#11
20140097362
2014-04-10

System and method for compressed data transmission in a maskless lithography system

#12
20130320225
2013-12-05

Devices and methods for improved reflective electron beam lithography

#13
20130293865
2013-11-07

Linear Stage for reflective electron beam lithography

#14
20110291021
2011-12-01

Reflection electron beam projection lithography using an ExB separator

#15
20110204251
2011-08-25

Electron reflector with multiple reflective modes

#16
20080128634
2008-06-05

Method and apparatus for surface potential reflection electron mask lithography

#17
20060008712
2006-01-12

Exposure method, mask fabrication method, fabrication method of semiconductor device, and exposure apparatus

#18
13287682
2015-01-13

Apparatus and methods for aberration correction in electron beam based system