207783 ⎘
Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto; Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto; Bonding areas ; Manufacturing methods related thereto Manufacturing methods
Scheme for connector site spacing and resulting structures
#3602Re-distribution Layer Via Structure and Method of Making Same
#3603Back-side contact formation
#3604Interconnect barrier structure and method
#3605THREE DIMENSIONAL MICROELECTRONIC COMPONENTS AND FABRICATION METHODS FOR SAME
#3606Chip packages and methods for manufacturing a chip package
#3607Semiconductor Constructions and Methods of Forming Semiconductor Constructions
#3608Semiconductor constructions and methods of planarizing across a plurality of electrically conductive posts
#3609Chip package and method for forming the same
#3610Low loop wire bonding
#3611Wire-based methodology of widening the pitch of semiconductor chip terminals
#3612Electric connecting structure comprising preferred oriented CuSngrains and method for fabricating the same
#3613Semiconductor device and method of forming guard ring around conductive TSV through semiconductor wafer
#3614Methods of forming bonded semiconductor structures
#3615CHIP CONNECTION STRUCTURE AND METHOD OF FORMING
#3616Protected solder ball joints in wafer level chip-scale packaging
#3617WSP DIE HAVING REDISTRIBUTION LAYER CAPTURE PAD WITH AT LEAST ONE VOID
#3618Cu pillar bump with electrolytic metal sidewall protection
#3619Method of forming an integrated circuit package including a direct connect pad, a blind via, and a bond pad electrically coupled to the direct connect pad
#3620Method for testing through-silicon-via (TSV) structures
#3621Chip package and method for forming the same
#3622Stack of semiconductor structures and corresponding manufacturing method
#3623Bump structure, having concave lateral sides, semiconductor package having the bump structure, and method of forming the bump structure
#3624Electronic device packages including bump buffer spring pads and methods of manufacturing the same
#3625Light emitting device chip scale package
#3626Semiconductor package and methods of formation thereof
#3627Electrochemical etching of semiconductors
#3628Method for obtaining a palladium surface finish for copper wire bonding on printed circuit boards and IC-substrates
#3629Electrical connection structure
#36303D interconnect structure comprising through-silicon vias combined with fine pitch backside metal redistribution lines fabricated using a dual damascene type approach
#3631Package structure and substrate bonding method
#3632Through silicon via with embedded barrier pad
#3633Semiconductor structure with low-melting-temperature conductive regions, and method of repairing a semiconductor structure
#3634Method for chip packaging
#3635Semiconductor device fabrication method capable of scribing chips with high yield
#3636SOLDERABLE PAD FABRICATION FOR MICROELECTRONIC COMPONENTS
#3637Chip pad resistant to antenna effect and method
#3638Methods and apparatus for solder connections
#3639Controlled solder-on-die integrations on packages and methods of assembling same
#3640Pad structure of a semiconductor device, method of manufacturing the pad structure and semiconductor package including the pad structure
#3641Cleaning methods and compositions
#3642Method to realize flux free indium bumping
#3643Offset interposers for large-bottom packages and large-die package-on-package structures
#3644Substrates having bumps with holes, semiconductor chips having bumps with holes, semiconductor packages formed using the same, and methods of fabricating the same
#3645Method for designing a package and substrate layout
#3646Process for direct bonding two elements comprising copper portions and portions of dielectric materials
#3647Etching solution for copper or copper alloy
#3648Semiconductor structures and methods of manufacture
#3649Semiconductor packages and methods of fabricating the same
#3650Bottom-up plating of through-substrate vias
#36513D interconnect structure comprising fine pitch single damascene backside metal redistribution lines combined with through-silicon vias
#3652Bonded processed semiconductor structures and carriers
#3653STACKED SEMICONDUCTOR COMPONENTS WITH UNIVERSAL INTERCONNECT FOOTPRINT
#3654Bonding pad structure with dense via array
#3655Shallow via formation by oxidation
#3656Semiconductor device
#3657SEMICONDUCTOR CHIP DEVICE WITH FRAGMENTED SOLDER STRUCTURE PADS
#3658Packaging device and method of making the same
#3659Semiconductor device and method of forming prefabricated heat spreader frame with embedded semiconductor die
#3660Semiconductor device and method of manufacturing the same
#3661Electromigration-resistant lead-free solder interconnect structures
#3662Method of manufacturing a semiconductor integrated circuit device
#3663Magnet assisted alignment method for wafer bonding and wafer level chip scale packaging
#3664Interposer for hermetic sealing of sensor chips and for their integration with integrated circuit chips
#3665Semiconductor device and method of forming micro-vias partially through insulating material over bump interconnect conductive layer for stress relief
#3666Conductive bump structure on substrate and fabrication method thereof
#3667Method for manufacturing fine-pitch bumps and structure thereof
#3668Semiconductor device and method for forming openings and trenches in insulating layer by first LDA and second LDA for RDL formation
#3669ELECTROMIGRATION-RESISTANT LEAD-FREE SOLDER INTERCONNECT STRUCTURES
#3670Bundled memory and manufacture method for a bundled memory with an external input/output bus
#3671Semiconductor device and method of simultaneous testing of multiple interconnects for electro-migration
#3672Method of manufacturing a semiconductor component
#3673Integrated circuit chip using top post-passivation technology and bottom structure technology
#3674Inductor for post passivation interconnect
#3675Semiconductor device and method of forming interposer and opposing build-up interconnect structure with connecting conductive TMV for electrical interconnect of FO-WLCSP
#3676Semiconductor structure and method of forming the same
#3677Stack semiconductor apparatus having a through silicon via and method of fabricating the same
#3678Methods and apparatus for solder on slot connections in package on package structures
#3679Methods and apparatus of guard rings for wafer-level-packaging
#3680Eutectic bonding of thin chips on a carrier substrate
#3681Semiconductor device bonding with stress relief connection pads
#3682Thin 3D fan-out embedded wafer level package (EWLB) for application processor and memory integration
#3683Semiconductor constructions
#3684Self-aligned polymer passivation/aluminum pad
#3685Semiconductor component that includes a protective structure
#3686Semiconductor device including a stress buffer material formed above a low-k metallization system
#3687Silicon carbide semiconductor device and manufacturing method thereof
#3688Protection layers for conductive pads and methods of formation thereof
#3689Semiconductor device and method of forming protective coating over interconnect structure to inhibit surface oxidation
#3690Method for manufacturing semiconductor devices having a glass substrate
#3691Electrical connections for chip scale packaging
#3692Method for package-on-package assembly with wire bonds to encapsulation surface
#3693Method for chip package
#3694Mechanisms for forming connectors with a molding compound for package on package
#3695Devices and methods related to interconnect conductors to reduce de-lamination
#3696Devices and methods related to electrostatic discharge protection benign to radio-frequency operation
#3697Bumping process and structure thereof
#3698Semiconductor devices having conductive via structures and methods for fabricating the same
#3699Methods of forming reverse side engineered III-nitride devices
#3700Semiconductor device, method for manufacturing semiconductor device, and electronic apparatus
#3701Method of manufacturing a semiconductor device and wafer
#3702Post-passivation interconnect structure AMD method of forming same
#3703Semiconductor chip comprising a plurality of contact pads and a plurality of associated pad cells
#3704Interconnect crack arrestor structure and methods
#3705Method of mounting semiconductor chips, semiconductor device obtained using the method, method of connecting semiconductor chips, three-dimensional structure in which wiring is provided on its surface, and method of producing the same
#3706Transfer substrate for forming metal wiring and method for forming metal wiring using said transfer substrate
#3707Method for building vertical pillar interconnect
#3708OPTIMIZATION OF COPPER PLATING THROUGH WAFER VIA
#3709BUMPING PROCESS AND STRUCTURE THEREOF
#3710Integrated Circuit Die And Method Of Fabricating
#3711Method for forming pad in wafer with three-dimensional stacking structure
#3712Semiconductor device and method of manufacturing the same
#3713Multi-chip fan out package and methods of forming the same
#3714Package assembly and method of forming the same
#3715Semiconductor packaging structure and method
#3716Backside integration of RF filters for RF front end modules and design structure
#3717Biosensor capacitor
#3718BUMPING PROCESS
#3719Bump pad structure
#3720Semiconductor devices with compliant interconnects
#3721Package on package interconnect structure
#3722Method of processing a contact pad
#3723Bonding pad and method of making same
#3724UBM formation for integrated circuits
#3725Method for manufacturing an electronic device by reducing thickness of electronic members attached to a carrier
#3726Semiconductor device having a through-substrate via
#3727Packaged semiconductor device with a molding compound and a method of forming the same
#3728Semiconductor package, packaging substrate and fabrication method thereof
#3729Semiconductor device and method of forming insulating layer in notches around conductive TSV for stress relief
#3730Techniques for wafer-level processing of QFN packages
#3731Manufacturing method of semiconductor device, processing method of semiconductor wafer, semiconductor wafer
#3732SEMICONDUCTOR DEVICE INCLUDING THROUGH ELECTRODE AND METHOD OF MANUFACTURING THE SAME AND STACKED PACKAGE INCLUDING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#3733Semiconductor device and method of forming vertical interconnect structure with conductive micro via array for 3-D Fo-WLCSP
#3734Integrated circuit packaging system with coupling features and method of manufacture thereof
#3735PAD OVER INTERCONNECT PAD STRUCTURE DESIGN
#3736Leadframe interposer over semiconductor die and TSV substrate for vertical electrical interconnect
#3737Semiconductor device and method of forming guard ring around conductive TSV through semiconductor wafer
#3738Device including two power semiconductor chips and manufacturing thereof
#3739Electrode connecting structures containing copper
#3740Semiconductor device and method of forming patterned repassivation openings between RDL and UBM to reduce adverse effects of electro-migration
#3741Electronic device with multi-layer contact
#3742Semiconductor devices including protected barrier layers
#3743Method of fabricating a wafer level semiconductor package having a pre-formed dielectric layer
#3744Electrical connection structure
#3745Wafer level chip scale package
#3746CONNECTING PAD PRODUCING METHOD
#3747Active area bonding compatible high current structures
#3748Method for packaging ultra-thin chip with solder ball thermo-compression in wafer level packaging process
#3749Thick film conductive composition and use thereof
#3750Integrated circuit having staggered bond pads and I/O cells
#3751Conductive structure and method for forming the same
#3752Mechanisms for forming fine-pitch copper bump structures
#3753Bumps for Chip Scale Packaging
#3754Through-silicon via with low-K dielectric liner
#3755Termination structure for gallium nitride schottky diode
#3756Vertical gallium nitride Schottky diode
#3757Method for separating a plurality of dies and a processing device for separating a plurality of dies
#3758Semiconductor structure having lateral through silicon via
#3759Semiconductor device
#3760Semiconductor device
#3761Post-passivation interconnect structure and method of forming the same
#3762Semiconductor device and method of forming interposer frame over semiconductor die to provide vertical interconnect
#3763Method of fabricating land grid array semiconductor package
#3764Flattened substrate surface for substrate bonding
#3765Electronic device and method for fabricating an electronic device
#3766TSV backside processing using copper damascene interconnect technology
#3767WAFER LEVEL CHIP SCALE PACKAGE DEVICE AND MANUFACTURING METHOD THEROF
#3768Semiconductor device and method of forming interposer frame electrically connected to embedded semiconductor die
#3769Methods of forming bump structures that include a protection layer
#3770SEMICONDUCTOR PACKAGE AND STACKED SEMICONDUCTOR PACKAGE
#3771Semiconductor device and method of forming conductive pillar having an expanded base
#3772Connector structures of integrated circuits
#3773Process for forming package-on-package structures
#3774Semiconductor structure and method for making same
#3775Semiconductor package having an anti-contact layer
#3776Methods of packaging semiconductor devices and structures thereof
#3777Copper Stud Bump Wafer Level Package
#3778Bump with protection structure
#3779ELECTRONIC PACKAGING CONNECTOR AND METHODS FOR ITS PRODUCTION
#3780Power management applications of interconnect substrates
#3781Microelectronic devices having intermediate contacts for connection to interposer substrates, and associated methods of packaging microelectronic devices with intermediate contacts
#3782SEMICONDUCTOR DEVICE
#3783Seal ring structure with a metal pad
#3784METHOD FOR MANUFACTURING SEMICONDUCTOR APPARATUS
#3785INTEGRATED CIRCUIT AND METHOD OF MAKING
#3786Semiconductor device and method of forming stacked vias within interconnect structure for Fo-WLCSP
#3787Semiconductor device and method of forming Fo-WLCSP having conductive layers and conductive vias separated by polymer layers
#3788Interconnection Between Integrated Circuit and Package
#3789Semiconductor device and method for manufacturing semiconductor device
#3790Integrated circuit and method of making
#3791Manufacturing method of semiconductor integrated circuit device
#3792Semiconductor device and method of forming protection and support structure for conductive interconnect structure
#3793Semiconductor device and method of forming protection and support structure for conductive interconnect structure
#3794Chips having rear contacts connected by through vias to front contacts
#3795Semiconductor integrated circuit device and method of manufacturing same
#3796Backplate interconnect with integrated passives
#3797Semiconductor structure and method for making same
#3798System and method for 3D integrated circuit stacking
#3799Low loop wire bonding
#3800Semiconductor package with improved pillar bump process and structure
#3801Packaging methods and structures for semiconductor devices
#3802Pillar structure having a non-planar surface for semiconductor devices
#3803ROUTING UNDER BOND PAD FOR THE REPLACEMENT OF AN INTERCONNECT LAYER
#3804Die-to-die gap control for semiconductor structure and method
#3805Self-aligned protection layer for copper post structure
#3806Methods of fabricating semiconductor chip solder structures
#3807Semiconductor laser mounting with intact diffusion barrier layer
#3808MEMS device having chip scale packaging
#3809Through silicon via layout
#3810Method for permanent connection of two metal surfaces
#3811Method of Multi-Chip Wafer Level Packaging
#3812Semiconductor device having a through-substrate via
#3813Semiconductor device, semiconductor package, method for manufacturing semiconductor device, and method for manufacturing semiconductor package
#3814Method for inhibiting growth of intermetallic compounds
#3815Wafer level package structure and the fabrication method thereof
#3816Semiconductor package with under bump metallization routing
#3817Method of fabricating a semiconductor device having recessed bonding site
#3818Method of forming a semiconductor device with a contact pad on a sloped silicon dioxide surface
#3819WAFER LEVEL PACKAGE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
#3820Routing layer for mitigating stress in a semiconductor die
#3821Semiconductor device comprising through-electrode interconnect
#3822Pad structure including glue layer and non-low-k dielectric layer in BSI image sensor chips
#3823Method of making a die with recessed aluminum die pads
#3824Method and system for forming conductive bumping with copper interconnection
#3825Method of manufacturing semiconductor device
#3826WAFER LEVEL CHIP SCALE PACKAGE FOR WIRE-BONDING CONNECTION
#3827Semiconductor device and manufacturing method therefor
#3828Integrated circuit package including a direct connect pad, a blind via, and a bond pad electrically coupled to the direct connect pad
#3829Electronic chip comprising connection pillars and manufacturing method
#3830Coaxial solder bump support structure
#3831Bump structures in semiconductor device and packaging assembly
#3832Fused buss for plating features on a semiconductor die
#3833Bumping process and structure thereof
#3834Composite layered chip package
#3835Contact pad
#3836Interconnect pillars with directed compliance geometry
#3837Bonding surfaces for direct bonding of semiconductor structures
#3838Semiconductor device and a method of manufacturing the same
#3839Solder ball contact susceptible to lower stress
#3840Solder bump with inner core pillar in semiconductor package
#3841Semiconductor device with solder bump formed on high topography plated Cu pads
#3842Method of forming an inductor on a semiconductor wafer
#3843Semiconductor device for improving electrical and mechanical connectivity of conductive pillers and method therefor
#3844UBM etching methods for eliminating undercut
#3845Semiconductor device, fabrication method for a semiconductor device and electronic apparatus
#3846Forming wafer-level chip scale package structures with reduced number of seed layers
#3847SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#3848SEMICONDUCTOR CHIP AND FLIP-CHIP PACKAGE COMPRISING THE SAME
#3849Ball-limiting-metallurgy layers in solder ball structures
#3850Electronic device
#3851Method of manufacturing semiconductor device
#3852Microfeature workpieces having alloyed conductive structures, and associated methods
#3853Semiconductor constructions
#3854Semiconductor device
#3855Interconnect barrier structure and method
#3856Multi-component integrated circuit contacts
#3857Copper wire receiving pad
#3858Electrically conductive paste, and electrically conducive connection member produced using the paste
#3859ELECTRIC JOINT STRUCTURE AND METHOD FOR PREPARING THE SAME
#3860MICRO PIN HYBRID INTERCONNECT ARRAY
#3861Methods for controlling wafer curvature
#3862Enhanced WLP for superior temp cycling, drop test and high current applications
#3863STACKED SEMICONDUCTOR DEVICE
#3864SEMICONDUCTOR CHIP WITH DUAL POLYMER FILM INTERCONNECT STRUCTURES
#3865Bump structure with barrier layer on post-passivation interconnect
#3866Semiconductor device and method of forming protective coating over interconnect structure to inhibit surface oxidation
#3867Semiconductor device and method of forming interconnect structure over seed layer on contact pad of semiconductor die without undercutting seed layer beneath interconnect structure
#3868Semiconductor device and manufacturing method
#3869Die backside standoff structures for semiconductor devices
#3870Bump structure and process of manufacturing the same
#3871Hermetically sealed wafer packages
#3872Back-side contact formation
#3873Electronic device and method for producing electronic device
#3874Method of forming a through-silicon via utilizing a metal contact pad in a back-end-of-line wiring level to fill the through-silicon via
#3875METHOD OF MANUFACTURING A SEMICONDUCTOR CHIP PACKAGE
#3876Layered chip package and method of manufacturing same
#3877Layered chip package and method of manufacturing same
#3878Fan-out microelectronic unit WLP having interconnects comprising a matrix of a high melting point, a low melting point and a polymer material
#3879Method for producing a protective structure
#3880Bonded semiconductor structures and methods of forming same
#3881Semiconductor device
#3882Semiconductor device and method of forming a power MOSFET with interconnect structure silicide layer and low profile bump
#3883Heterostructure containing IC and LED and method for fabricating the same
#3884CONDUCTIVE STRUCTURE FOR A SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR FORMING THE SAME
#3885Method of fabricating semiconductor device
#3886Implantable microelectronic device and method of manufacture
#3887Method of manufacturing a semiconductor device
#3888Semiconductor device and method of forming interconnect structure with conductive pads having expanded interconnect surface area for enhanced interconnection properties
#3889Conductive pads defined by embedded traces
#3890Methods of forming through-substrate interconnects
#3891Wafer-level package device
#3892Electrical connection for chip scale packaging
#3893Injection molded solder process for forming solder bumps on substrates
#3894Injection molded solder process for forming solder bumps on substrates
#3895Aluminum Bond Pad With Trench Thinning for Fine Pitch Ultra-Thick Aluminum Products
#3896Semiconductor device having a trace comprises a beveled edge
#3897SEMICONDUCTOR COMPONENT AND METHOD OF FABRICATING THE SAME
#3898Semiconductor device and method of forming bump structure with multi-layer UBM around bump formation area
#3899Semiconductor device and method of stacking semiconductor die in mold laser package interconnected by bumps and conductive vias
#3900Semiconductor device and method of forming shielding layer over semiconductor die mounted to TSV interposer