Menlo Park, California
United States
9
2020-03-05
The entities that hold a legal rights for patent applications filed by inventor Wiley James:
James Wiley from Menlo Park, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Methods and systems for inspection of wafers and reticles using designer intent data
#2 | 2018-08-30Methods and systems for inspection of wafers and reticles using designer intent data
#3 | 2015-06-25Methods and Systems for Inspection of Wafers and Reticles Using Designer Intent Data
#4 | 2012-01-26Process window signature patterns for lithography process control
#5 | 2010-06-17Process window signature patterns for lithography process control
#6 | 2008-04-03METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA
#7 | 2007-03-01Method for identifying and using process window signature patterns for lithography process control
#8 | 2006-11-21Method and apparatus for protecting surfaces of optical components
#9 | 2005-01-06Methods and systems for inspection of wafers and reticles using designer intent data
1207808 ⎘