Inventor profile of:

David Bour

City:

Cupertino, California

Country:

United States

Published Applications:

35

Last publication date:

2013-06-13

Top Assignees for applications by David Bour

The entities that hold a legal rights for patent applications filed by inventor Bour David:

Recent patent applications by Bour David

David Bour from Cupertino, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2013-06-13
US20130146885A1
Electricity

Vertical GaN-based metal insulator semiconductor FET

#2 | 2013-05-23
US20130126888A1
Electricity

Edge termination by ion implantation in GaN

#3 | 2012-12-13
US20120315741A1
Electricity

ENHANCED MAGNESIUM INCORPORATION INTO GALLIUM NITRIDE FILMS THROUGH HIGH PRESSURE OR ALD-TYPE PROCESSING

#4 | 2012-10-11
US20120258581A1
Electricity

MOCVD FABRICATION OF GROUP III-NITRIDE MATERIALS USING IN-SITU GENERATED HYDRAZINE OR FRAGMENTS THERE FROM

#5 | 2012-10-11
US20120258580A1
Electricity

PLASMA-ASSISTED MOCVD FABRICATION OF P-TYPE GROUP III-NITRIDE MATERIALS

#6 | 2012-09-20
US20120235115A1
Electricity

GROWTH OF III-V LED STACKS USING NANO MASKS

#7 | 2012-09-13
US20120227667A1
Chemistry; metallurgy

SUBSTRATE CARRIER WITH MULTIPLE EMISSIVITY COEFFICIENTS FOR THIN FILM PROCESSING

#8 | 2012-04-05
US20120083060A1
Electricity

INTEGRATION OF CLUSTER MOCVD AND HVPE REACTORS WITH OTHER PROCESS CHAMBERS

#9 | 2012-03-01
US20120052216A1
Chemistry; metallurgy

GAS DISTRIBUTION SHOWERHEAD WITH HIGH EMISSIVITY SURFACE

#10 | 2012-01-19
US20120015502A1
Electricity

p-GaN Fabrication Process Utilizing a Dedicated Chamber and Method of Minimizing Magnesium Redistribution for Sharper Decay Profile

#11 | 2011-12-22
US20110308551A1
Performing operations; transporting

Method and apparatus for inducing turbulent flow of a processing chamber cleaning gas

#12 | 2011-12-22
US20110308453A1
Electricity

CLOSED LOOP MOCVD DEPOSITION CONTROL

#13 | 2011-08-25
US20110204376A1
Electricity

GROWTH OF MULTI-JUNCTION LED FILM STACKS WITH MULTI-CHAMBERED EPITAXY SYSTEM

#14 | 2011-03-24
US20110070721A1
Chemistry; metallurgy

EPITAXIAL GROWTH OF COMPOUND NITRIDE SEMICONDUCTOR STRUCTURES

#15 | 2009-04-16
US20090095221A1
Chemistry; metallurgy

MULTI-GAS CONCENTRIC INJECTION SHOWERHEAD

#16 | 2008-12-04
US20080296594A1
Electricity

NITRIDE OPTOELECTRONIC DEVICES WITH BACKSIDE DEPOSITION

#17 | 2008-08-28
US20080206902A1
Electricity

STRESS MEASUREMENTS DURING LARGE-MISMATCH EPITAXIAL PROCESSES

#18 | 2008-05-29
US20080124817A1
Electricity

Stress measurement and stress balance in films

#19 | 2008-05-29
US20080124463A1
Chemistry; metallurgy

System and method for depositing a gaseous mixture onto a substrate surface using a showerhead apparatus

#20 | 2008-05-29
US20080124453A1
Chemistry; metallurgy

IN-SITU DETECTION OF GAS-PHASE PARTICLE FORMATION IN NITRIDE FILM DEPOSITION

#21 | 2008-04-24
US20080092819A1
Chemistry; metallurgy

SUBSTRATE SUPPORT STRUCTURE WITH RAPID TEMPERATURE CHANGE

#22 | 2008-02-28
US20080050889A1
Chemistry; metallurgy

Hotwall reactor and method for reducing particle formation in GaN MOCVD

#23 | 2007-11-08
US20070259504A1
Chemistry; metallurgy

Dislocation-specific lateral epitaxial overgrowth to reduce dislocation density of nitride films

#24 | 2007-11-08
US20070259502A1
Chemistry; metallurgy

Parasitic particle suppression in growth of III-V nitride films using MOCVD and HVPE

#25 | 2007-11-08
US20070259464A1
Electricity

Dislocation-specific dielectric mask deposition and lateral epitaxial overgrowth to reduce dislocation density of nitride films

#26 | 2007-11-08
US20070256635A1
Chemistry; metallurgy

UV activation of NH3 for III-N deposition

#27 | 2007-11-01
US20070254458A1
Electricity

Buffer-layer treatment of MOCVD-grown nitride structures

#28 | 2007-11-01
US20070254390A1
Electricity

Nitride optoelectronic devices with backside deposition

#29 | 2007-11-01
US20070254100A1
Chemistry; metallurgy

MOCVD reactor without metalorganic-source temperature control

#30 | 2007-11-01
US20070254093A1
Chemistry; metallurgy

MOCVD reactor with concentration-monitor feedback

#31 | 2007-10-18
US20070243702A1
Electricity

Dual-side epitaxy processes for production of nitride semiconductor structures

#32 | 2007-10-18
US20070243652A1
Chemistry; metallurgy

Stacked-substrate processes for production of nitride semiconductor structures

#33 | 2007-10-18
US20070241351A1
Electricity

Double-sided nitride structures

#34 | 2007-10-18
US20070240631A1
Chemistry; metallurgy

Epitaxial growth of compound nitride semiconductor structures

#35 | 2007-02-20
US10367200
-

Laser employing a zinc-doped tunnel-junction

InventorID:

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