Sunnyvale, California
United States
33
2025-08-21
The entities that hold a legal rights for patent applications filed by inventor Biellak Stephen:
Stephen Biellak from Sunnyvale, US has applied for patents for these inventions. The list has both pending applications and granted patents:
SAMPLE INSPECTION WITH MULTIPLE MEASUREMENT MODES
#2 | 2021-11-23Systems and methods for advanced defect ablation protection
#3 | 2020-06-23Radiation-induced false count mitigation and detector cooling
#4 | 2019-09-19Multi-pass imaging using image sensors with variably biased channel-stop contacts for identifying defects in a semiconductor die
#5 | 2019-09-19Spread-spectrum clock-signal adjustment for image sensors
#6 | 2019-04-11Image sensors with grounded or otherwise biased channel-stop contacts
#7 | 2018-06-14Wafer inspection
#8 | 2018-02-15System and method for reducing radiation-induced false counts in an inspection system
#9 | 2017-05-09Detection of selected defects in relatively noisy inspection data
#10 | 2016-11-17System and method for reducing radiation-induced false counts in an inspection system
#11 | 2016-05-31Detection of selected defects in relatively noisy inspection data
#12 | 2016-04-07TDI sensor in a darkfield system
#13 | 2016-01-28High resolution high quantum efficiency electron bombarded CCD or CMOS imaging sensor
#14 | 2015-12-24Wafer inspection
#15 | 2014-11-06Illumination energy management in surface inspection
#16 | 2014-09-18Multi-spot defect inspection system
#17 | 2014-05-01Sample inspection system detector
#18 | 2014-05-01Illumination energy management in surface inspection
#19 | 2014-03-06Image intensifier tube design for aberration correction and ion damage reduction
#20 | 2013-11-12Systems and methods for inspecting specimens including specimens that have a substantially rough uppermost layer
#21 | 2013-09-26Laser with integrated multi line or scanning beam capability
#22 | 2013-09-12Wafer inspection with multi-spot illumination and multiple channels
#23 | 2013-08-27Segmented polarizer for optimizing performance of a surface inspection system
#24 | 2013-01-17Wafer inspection
#25 | 2012-10-23Fast laser power control with improved reliability for surface inspection
#26 | 2012-05-01Segmented polarizer for optimizing performance of a surface inspection system
#27 | 2010-03-11Computer-implemented methods for inspecting and/or classifying a wafer
#28 | 2009-12-03Systems and methods for determining two or more characteristics of a wafer
#29 | 2009-11-24Systems and methods for inspecting wafers
#30 | 2009-02-12Systems configured to inspect a wafer
#31 | 2008-12-09Systems and methods for determining a characteristic of a specimen
#32 | 2007-04-12Methods and systems for inspection of a wafer
#33 | 2006-09-07Enhanced simultaneous multi-spot inspection and imaging
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