Lambert Danner

City:

Wetzlar-Naunheim

Country:

Germany

Published Applications:

Last publication date:

2007-10-25

Top Assignees for applications by Lambert Danner

The entities that hold a legal rights for patent applications filed by inventor Danner Lambert:

Leica Microsystems Semiconductor GmbH 4 Wetzlar, Germany
VISTEC Semiconductor Systems GmbH 1 Wetzlar, Germany
VISTEC SEMICONDUCTOR SYSTEMS GMBH 1 Weilburg, Germany
LEICA MICROSYSTEMS CMS GMBH 1 Wetzlar, Germany

Recent patent applications by Danner Lambert

Lambert Danner from Wetzlar-Naunheim, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2007-10-25

US20070247618A1

Physics

Apparatus and method for inspecting micro-structured devices on a semiconductor substrate

#2 | 2007-09-11

US10475559

Illuminating device

#3 | 2007-04-24

US10776256

Illumination device, and coordinate measuring instrument having an illumination device

#4 | 2005-12-13

US9893998

Illumination device; and coordinate measuring instrument having an illumination device

#5 | 2005-11-24

US20050259245A1

Physics

Device and method for inspecting an object

#6 | 2005-09-13

US10672048

Critical dimension measuring instrument

#7 | 2005-04-12

US10355868

Autofocus module and method for a microscope-based system

InventorID:

4509267 ⎘