Davis, California
United States
34
2024-05-30
The entities that hold a legal rights for patent applications filed by inventor Wu Kenong:
Kenong Wu from Davis, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Print check repeater defect detection
#2 | 2021-11-04Print check repeater defect detection
#3 | 2020-08-13System, method and non-transitory computer readable medium for tuning sensitivities of, and determining a process window for, a modulated wafer
#4 | 2020-03-19Detecting defects in a logic region on a wafer
#5 | 2020-03-05High accuracy of relative defect locations for repeater analysis
#6 | 2019-05-09System and method for aligning semiconductor device reference images and test images
#7 | 2018-11-15High accuracy of relative defect locations for repeater analysis
#8 | 2018-05-24System, method and non-transitory computer readable medium for tuning sensitivies of, and determining a process window for, a modulated wafer
#9 | 2017-10-05Adaptive local threshold and color filtering
#10 | 2017-10-05System and method for defining care areas in repeating structures of design data
#11 | 2017-06-01Methods to store dynamic layer content inside a design file
#12 | 2017-03-30Detecting defects on a wafer using defect-specific and multi-channel information
#13 | 2017-03-16Wafer Defect Discovery
#14 | 2016-05-05Wafer defect discovery
#15 | 2016-04-14Defect detection using structural information
#16 | 2016-03-10Detecting defects on a wafer using defect-specific information
#17 | 2016-03-03Array mode repeater detection
#18 | 2016-03-03Repeater detection
#19 | 2016-01-28Detecting defects on a wafer using defect-specific and multi-channel information
#20 | 2015-08-06Defect detection and classification based on attributes determined from a standard reference image
#21 | 2015-02-12Adaptive local threshold and color filtering
#22 | 2014-12-25Wafer inspection using free-form care areas
#23 | 2014-08-07Detecting defects on a wafer using defect-specific and multi-channel information
#24 | 2014-04-17Detecting defects on a wafer using defect-specific information
#25 | 2014-03-13Selecting parameters for defect detection methods
#26 | 2012-06-07Region based virtual fourier filter
#27 | 2012-05-10Data perturbation for wafer inspection or metrology setup using a model of a difference
#28 | 2011-12-29Selecting one or more parameters for inspection of a wafer
#29 | 2010-09-09Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle
#30 | 2009-11-26METHODS AND SYSTEMS FOR BINNING DEFECTS DETECTED ON A SPECIMEN
#31 | 2008-04-15Automatic supervised classifier setup tool for semiconductor defects
#32 | 2007-06-14Methods and systems for binning defects detected on a specimen
#33 | 2006-12-28Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle
#34 | 2006-11-23Flexible hybrid defect classification for semiconductor manufacturing
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