ClassID:

206614

H01J2237/3171 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion beam tubes for processing objects; Processing objects on a microscale; Ion implantation characterised by the area treated patterned

Sub-classes:
Recent Application in this class:
#1
20250285877
2025-09-11

FEATURE PATTERNING USING PITCH RELAXATION AND DIRECTIONAL END-PUSHING WITH ION BOMBARDMENT

#2
20250014854
2025-01-09

ENERGY FILTER ELEMENT FOR ION IMPLANTATION SYSTEMS FOR THE USE IN THE PRODUCTION OF WAFERS

#3
20240055217
2024-02-15

Energy filter element for ion implantation systems for the use in the production of wafers

#4
20230298901
2023-09-21

Feature patterning using pitch relaxation and directional end-pushing with ion bombardment

#5
20220102162
2022-03-31

Feature patterning using pitch relaxation and directional end-pushing with ion bombardment

#6
20220020556
2022-01-20

Energy filter element for ion implantation systems for the use in the production of wafers

#7
20210040604
2021-02-11

Ion implanter irradiating ion mean onto wafer and ion implantation method using the same

#8
20210027975
2021-01-28

Energy filter element for ion implantation systems for the use in the production of wafers

#9
20190122850
2019-04-25

Energy filter element for ion implantation systems for the use in the production of wafers

#10
20160254122
2016-09-01

Method for generating parameter pattern, ion implantation method and feed forward semiconductor manufacturing method

#11
20140037858
2014-02-06

ANISOTROPIC SURFACE ENERGY MODULATION BY ION IMPLANTATION

#12
20120322248
2012-12-20

Ion implantation apparatus and ion implantation method

#13
20110299194
2011-12-08

Method of manufacturing magnetic recording medium, and magnetic recording medium

#14
20110278478
2011-11-17

METHOD AND IMPLANTER FOR IMPLANTING A WORKPIECE

#15
20110204264
2011-08-25

Ion implantation through laser fields

#16
20110084216
2011-04-14

Method for treating non-planar structures using gas cluster ion beam processing

#17
20090114853
2009-05-07

Manufacturing system for semiconductor device capable of controlling variation in electrical property of element in wafer surface and method for manufacturing the semiconductor device

#18
20090078890
2009-03-26

Ion source, ion implantation apparatus, and ion implantation method

#19
20080067434
2008-03-20

Non-uniform ion implantation

#20
20080049888
2008-02-28

High brightness—multiple beamlets source for patterned X-ray production

#21
20070023696
2007-02-01

Nonuniform ion implantation apparatus and method using a wide beam

#22
20060258128
2006-11-16

Methods and apparatus for enabling multiple process steps on a single substrate

#23
20050077486
2005-04-14

Device and method of positionally accurate implantation of individual particles in a substrate surface