207205 ⎘
Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof; Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AB compounds with or without impurities, e.g. doping materials; Bombardment with radiation with high-energy radiation
Sub-classes:APERTURE CORRECTION AMOUNT CALCULATION METHOD FOR APERTURE ARRAY SUBSTRATE, APERTURE ARRAY SUBSTRATE, BLANKING APERTURE ARRAY SUBSTRATE, MULTIPLE CHARGED-PARTICLE BEAM WRITING APPARATUS, AND MULTIPLE CHARGED-PARTICLE BEAM WRITING METHOD
#2GROUND RETURN PATH FOR WAFER PROCESS CHAMBER
#3Workpiece Processing Apparatus with Outer Gas Channel Insert
#4CHARGED PARTICLE BEAM WRITING APPARATUS, SHOT DATA CORRECTION METHOD AND CHARGED PARTICLE BEAM WRITING METHOD
#5Plasma Strip Tool With Movable Insert
#6SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#7SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
#8SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#9ION BEAM INSPECTION AND REPAIR WITH INCREASED SECONDARY ELECTRON YIELD
#10METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION BEAM AND AN INNOVATIVE SCANNING STRATEGY
#11METHOD FOR PRODUCING NITRIDE SEMICONDUCTOR WAFER
#12METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION BEAM AND AN INNOVATIVE SCANNING STRATEGY
#13Enhanced Ignition in Inductively Coupled Plasmas For Workpiece Processing
#14SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#15METHOD FOR PRODUCING SEMICONDUCTOR APPARATUS FOR QUANTUM COMPUTER
#16Method and Apparatus for Plasma Processing
#17Charged particle source module
#18Processing method for semiconductor surface defects and preparation method for semiconductor devices
#19TRANSISTORS INCLUDING SEMICONDUCTOR SURFACE MODIFICATION AND RELATED FABRICATION METHODS
#20Enhanced ignition in inductively coupled plasmas for workpiece processing
#21SUBSTRATE PROCESSING APPARATUS
#22SUBSTRATE PROCESSING APPARATUS, PLASMA GENERATING DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SUBSTRATE PROCESSING METHOD
#23MICROWAVE SUPPLY MECHANISM, PLASMA TREATMENT APPARATUS, AND PLASMA TREATMENT METHOD
#24Workpiece Processing Apparatus with Outer Gas Channel Insert
#25Directly Driven Hybrid ICP-CCP Plasma Source
#26Grid Assembly for Plasma Processing Apparatus
#27Plasma strip tool with movable insert
#28Method for manufacturing semiconductor device, method for packaging semiconductor chip, method for manufacturing shallow trench isolation (STI)
#29Electron beam lithography with dynamic fin overlay correction
#30Semiconductor device and method of manufacturing semiconductor device
#31SHOWER PLATE, SUBSTRATE TREATMENT DEVICE, AND SUBSTRATE TREATMENT METHOD
#32Method of forming a semiconductor device
#33Particle beam apparatus, defect repair method, lithographic exposure process and lithographic system
#34Substrate processing system and substrate processing method
#35Substrate processing method, modification device and substrate processing system
#36Substrates including useful layers
#37Semiconductor device and method for producing semiconductor device
#38Semiconductor device and method for manufacturing the same
#39Semiconductor device and method for manufacturing semiconductor device
#40Enhanced ignition in inductively coupled plasmas for workpiece processing
#41Semiconductor device and method of manufacturing semiconductor device
#42Semiconductor device and manufacturing method of semiconductor device
#43Semiconductor device and method for manufacturing semiconductor device
#44Fabricating unique chips using a charged particle multi-beamlet lithography system
#45Method of manufacturing a semiconductor device in which a lifetime of carriers is controlled
#46Systems and methods for controlling plasma instability in semiconductor fabrication
#47Method and apparatus for plasma processing
#48Manufacturing method of semiconductor device
#49Charged particle source module
#50Fabricating unique chips using a charged particle multi-beamlet lithography system
#51Apparatus and method for bonding substrates
#52Method of manufacturing semiconductor device
#53Substrate treating apparatus and substrate treating method
#54Method of forming a semiconductor device
#55Semiconductor device and method for producing semiconductor device
#56Wrap around contact
#57Semiconductor manufacturing apparatus and method of manufacturing semiconductor device
#58Method for transferring a useful layer
#59Semiconductor device and method of manufacturing semiconductor device
#60Semiconductor device and method for producing semiconductor device
#61Solder reflow apparatus and method of manufacturing an electronic device
#62Method of manufacturing a semiconductor device having an undulated profile of net doping in a drift zone
#63Semiconductor device having super junction metal oxide semiconductor structure and fabrication method for the same
#64Power semiconductor device and method of fabricating the same
#65Semiconductor device and method for manufacturing the same
#66METHOD OF TRANSFERRING MICRO DEVICE
#67Semiconductor device having semiconductor regions with an impurity concentration distribution which decreases from a respective peak toward different semiconductor layers
#68Method for manufacturing semiconductor device having via formed by ion beam
#69Semiconductor device and manufacturing method of semiconductor device
#70Semiconductor device and method for manufacturing semiconductor device
#71Semiconductor device and method for producing semiconductor device
#72Semiconductor device and method of manufacturing semiconductor device
#73Semiconductor device and method for producing semiconductor device
#74Proton radiation as a tool for selective degradation and physics based device model test and calibration
#75Semiconductor device and method for manufacturing semiconductor device
#76Production method for semiconductor device
#77Semiconductor device having multiple field stop layers
#78Methods for forming wrap around contact
#79Method of manufacturing semiconductor device
#80Semiconductor device with a guard structure and corresponding methods of manufacture
#81High electron mobility transistor manufacturing method and high electron mobility transistor
#82Substrate treating apparatus and substrate treating method
#83Method of forming fine patterns of a semiconductor device
#84Semiconductor device
#85Power semiconductor device and method therefor
#86Power semiconductor device and method therefor
#87Apparatus and method for bonding substrates
#88Fabricating unique chips using a charged particle multi-beamlet lithography system
#89Semiconductor device having a variable carbon concentration
#90Systems and methods for detection of plasma instability by electrical measurement
#91Metallization and its use in, in particular, an IGBT or a diode
#92METHOD TO TUNE CONTACT CD AND REDUCE MASK COUNT BY TILTED ION BEAM
#93Semiconductor device containing oxygen-related thermal donors
#94Semiconductor device having super junction metal oxide semiconductor structure and fabrication method for the same
#95Semiconductor device including crystal defect region and method for manufacturing the same
#96Method of reducing an impurity concentration in a semiconductor body
#97Semiconductor device and manufacturing method of semiconductor device
#98Semiconductor devices and methods for forming a semiconductor device
#99Semiconductor layer separation from single crystal silicon substrate by infrared irradiation of porous silicon separation layer
#100Method of manufacturing a semiconductor device having an impurity concentration
#101Semiconductor device manufacturing method
#102Semiconductor device and method for producing semiconductor device
#103Non-overlapped-extension-implantation nonvolatile memory device capable of being treated with anti-fuse operation
#104Plasma poisoning to enable selective deposition
#105Semiconductor device and method for producing semiconductor device
#106Semiconductor device and method of manufacturing the same
#107Method for manufacturing nonvolatile memory thin film device by using neutral particle beam generation apparatus
#108Semiconductor device having a super junction structure
#109Semiconductor device and method of manufacturing semiconductor device
#110Method forming a graphene oxide-reduced graphene oxide junction
#111Semiconductor wafer and method of manufacturing semiconductor devices in a semiconductor wafer
#112Method for removing crystal originated particles from a crystalline silicon body using an etch process
#113Method of forming a semiconductor device
#114CONTROLLED DOPING FROM LOW TO HIGH LEVELS IN WIDE BANDGAP SEMICONDUCTORS
#115Microwave probe, plasma monitoring system including the microwave probe, and method for fabricating semiconductor device using the system
#116Systems and methods for frequency modulation of radiofrequency power supply for controlling plasma instability
#117Systems and methods for detection of plasma instability by optical diagnosis
#118Systems and methods for controlling plasma instability in semiconductor fabrication
#119Method of forming a semiconductor device
#120Method of manufacturing semiconductor wafers and method of manufacturing a semiconductor device
#121Semiconductor device including crystal defect region and method for manufacturing the same
#122Semiconductor device
#123Method for high throughput using beam scan size and beam position in gas cluster ion beam processing system
#124Microwave probe, plasma monitoring system including the microwave probe, and method for fabricating semiconductor device using the system
#125Float zone silicon wafer manufacturing system and related process
#126SOI wafer manufacturing process and SOI wafer
#127Thin heated substrate support
#128Semiconductor device and semiconductor device manufacturing method
#129Semiconductor structures including carrier wafers and attached device wafers, and methods of forming such semiconductor structures
#130Power semiconductor device edge structure
#131Integrated circuit structure
#132Semiconductor device and method of manufacturing semiconductor device
#133Methods for forming a semiconductor device and a semiconductor device
#134Semiconductor device and method of manufacturing the semiconductor device
#135Methods for forming wrap around contact
#136Semiconductor device and method of manufacturing semiconductor device
#137Method for forming surface oxide layer on amorphous silicon
#138Semiconductor device having an impurity concentration and method of manufacturing thereof
#139Method for manufacturing vertical super junction drift layer of power semiconductor devices
#140Semiconductor device and manufacturing method of semiconductor device
#141Method for controlling surface charge on wafer surface in semiconductor fabrication
#142Semiconductor device having super junction metal oxide semiconductor structure and fabrication method for the same
#143Semiconductor device having multiple field stop layers
#144Manufacturing method for semiconductor device
#145Methods for reducing metal contamination on a surface of a sapphire substrate by plasma treatment
#146Wafer structure for electronic integrated circuit manufacturing
#147Semiconductor device and method for producing semiconductor device
#148Non-ambipolar electric pressure plasma uniformity control
#149Wafer structure for electronic integrated circuit manufacturing
#150Semiconductor device and method for manufacturing the same
#151Semiconductor device security
#152Semiconductor device security
#153Method for producing a semiconductor
#154Apparatus and method for bonding substrates including changing a stoichiometry of oxide layers formed on the substrates
#155Manufacturing method for semiconductor device with point defect region doped with transition metal
#156Semiconductor device, method of manufacturing the same, and power module
#157Semiconductor switch
#158Semiconductor device and manufacturing method of the same
#159Semiconductor device and method for producing semiconductor device
#160Method for forming a semiconductor device and a semiconductor device
#161Semiconductor device and method for manufacturing semiconductor device
#162Composite substrate and method for manufacturing same
#163Method for postdoping a semiconductor wafer
#164Semiconductor device, and method of manufacturing semiconductor device
#165Laser annealing device including tunable mask and method of using the same
#166Processing systems and methods for halide scavenging
#167Diodes and methods of manufacturing diodes
#168Semiconductor multi-project or multi-product wafer process
#169Semiconductor device including a super junction MOSFET
#170MIM capacitors for leakage current improvement
#171Method for reducing nonuniformity of forward voltage of semiconductor wafer
#172Method for treating a semiconductor wafer
#173Semiconductor device
#174Processing systems and methods for halide scavenging
#175Selective dielectric spacer deposition for exposing sidewalls of a finFET
#176Semiconductor device and manufacturing method therefor
#177Method for removing crystal originated particles from a crystalline silicon body
#178Temperature ramping using gas distribution plate heat
#179Method of creation of defects using X-ray radiation and electric field and its application
#180SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#181Composite substrate with a high-performance semiconductor layer and method of manufacturing the same
#182Enhanced stitching by overlap dose and feature reduction
#183Operating process for an irradiation device
#184Semiconductor device and manufacturing method of the same
#185Semiconductor device manufacturing method and semiconductor manufacturing apparatus
#186Semiconductor device manufacturing method
#187Semiconductor device including undulated profile of net doping in a drift zone
#188Method for manufacturing semiconductor device
#189System and method for generating ions in an ion source
#190Semiconductor element including active region, low resistance layer and vertical drift portion
#191Semiconductor device and method for manufacturing the same
#192Pattern formation method, stamper manufacturing method, and magnetic recording medium manufacturing method
#193Plasma processing method and plasma processing apparatus
#194MANUFACTURABLE SUB-3 NANOMETER PALLADIUM GAP DEVICES FOR FIXED ELECTRODE TUNNELING RECOGNITION
#195Integrated circuit structure to resolve deep-well plasma charging problem and method of forming the same
#196Electronic device having carbon layer and method for manufacturing the same
#197SiC bipolar junction transistor with reduced carrier lifetime in collector and a defect termination layer
#198Multi charged particle beam writing apparatus and multi charged particle beam writing method
#199Method for producing a semiconductor
#200Gettering process for producing semiconductor device
#201Production method for a semiconductor device
#202Method for postdoping a semiconductor wafer
#203Compound semiconductor device and method of manufacturing the same
#204Drawing apparatus, and method of manufacturing article
#205Manufacturing method for semiconductor device
#206Etch process for reducing directed self assembly pattern defectivity using direct current positioning
#207SYSTEMS FOR AUTOMATICALLY CHARACTERIZING A PLASMA
#208Production method for semiconductor device
#209Method for fabricating a composite structure to be separated by exfoliation
#210Semiconductor device manufacturing method
#211Semiconductor device having super junction metal oxide semiconductor structure and fabrication method for the same
#212Method and system for modifying substrate relief features using ion implantation
#213Semiconductor device and manufacturing method therefor
#214Semiconductor device
#215Semiconductor device and method for manufacturing semiconductor device
#216NON-AMBIPOLAR ELECTRIC PRESSURE PLASMA UNIFORMITY CONTROL
#217High density plasma reactor with multiple top coils
#218Charged particle beam writing apparatus, aperture unit, and charged particle beam writing method
#219Processing systems and methods for halide scavenging
#220Processing systems and methods for halide scavenging
#221Processing systems and methods for halide scavenging
#222Processing systems and methods for halide scavenging
#223Scalable and uniformity controllable diffusion plasma source
#224Processing systems and methods for halide scavenging
#225Wafer processing method
#226Semiconductor device and method for producing semiconductor device
#227Semiconductor device and method for producing semiconductor device
#228Method of manufacturing a super-junction semiconductor device
#229Lateral devices containing permanent charge
#230Bipolar semiconductor switch and a manufacturing method therefor
#231Semiconductor device and method of manufacturing semiconductor device
#232Multi charged particle beam writing apparatus and multi charged particle beam writing method
#233Method and system for forming a pattern on a reticle using charged particle beam lithography
#234Laser annealing device and method
#235Increasing the doping efficiency during proton irradiation
#236Charged particle beam writing apparatus and charged particle beam writing method
#237Reaction tube, substrate processing apparatus and method of manufacturing semiconductor device
#238Semiconductor device with point defect region doped with transition metal
#239Method for producing a semiconductor layer
#240Bonding-substrate fabrication method, bonding substrate, substrate bonding method, bonding-substrate fabrication apparatus, and substrate assembly
#241Apparatus and methods for microwave processing of semiconductor substrates
#242Semiconductor device with laterally varying doping concentrations
#243THIN HEATED SUBSTRATE SUPPORT
#244Substrate processing with reduced warpage and/or controlled strain
#245Integrated circuit structure to resolve deep-well plasma charging problem and method of forming the same
#246Method of and apparatus for evaluating an optimal irradiation amount of an electron beam for drawing a pattern onto a sample
#247Remote radical hydride dopant incorporation for delta doping in silicon
#248SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#249Substrate processing apparatus and method for manufacturing semiconductor device
#250Multi charged particle beam writing apparatus and multi charged particle beam writing method
#251Method for producing a semiconductor
#252Wafer structure for electronic integrated circuit manufacturing
#253Wafer structure for electronic integrated circuit manufacturing
#254Metallization and Its Use In, In Particular, an IGBT or a Diode
#255Semiconductor device and manufacturing method thereof
#256Semiconductor device including insulated gate bipolar transistor and diode
#257Semiconductor device and fabrication method
#258Integrated circuit having doped semiconductor body and method
#259Semiconductor device and method for manufacturing semiconductor device
#260BORON-DOPED DIAMOND SEMICONDUCTOR
#261Semiconductor device, method of manufacturing the same, and power module
#262Selective emitter solar cells formed by a hybrid diffusion and ion implantation process
#263Ion implanted solar cells with in situ surface passivation
#264Semiconductor multi-project or multi-product wafer process
#265SUBSTRATE PROCESSING WITH REDUCED WARPAGE AND/OR CONTROLLED STRAIN
#266Semiconductor device and method of producing the same
#267Semiconductor device having both IGBT area and diode area
#268Compound semiconductor device and method of manufacturing the same
#269Method of manufacturing semiconductor device
#270Metallization and its use in, in particular, an IGBT or a diode
#271Semiconductor device and fabrication method
#272Method and system for modifying substrate relief features using ion implantation
#273Semiconductor device having super junction metal oxide semiconductor structure and fabrication method for the same
#274Reverse recovery using oxygen-vacancy defects
#275Ion implanted selective emitter solar cells with in situ surface passivation
#276Selective emitter solar cells formed by a hybrid diffusion and ion implantation process
#277Substrate processing method and semiconductor device manufacturing method including a proton injection step and a laser irradiation step
#278Semiconductor device and method of producing the same
#279THIN FILM SOLAR CELL AND MANUFACTURING METHOD THREOF, METHOD FOR INCREASING CARRIER MOBILITY IN SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
#280Wafer and a method for manufacturing a wafer
#281METHOD FOR TREATING AN OXYGEN-CONTAINING SEMICONDUCTOR WAFER, AND SEMICONDUCTOR COMPONENT
#282Substrate processing with reduced warpage and/or controlled strain
#283SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#284Method for producing a semiconductor
#285Method for producing a buried n-doped semiconductor zone in a semiconductor body and semiconductor component
#286Method of fabricating a diode
#287TRANSISTOR HAVING A STRAINED CHANNEL REGION CAUSED BY HYDROGEN-INDUCED LATTICE DEFORMATION
#288Method for producing a stop zone in a semiconductor body and semiconductor component having a stop zone
#289Semiconductor device with semi-insulating substrate portions
#290SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#291Methods for automatically characterizing a plasma
#292Boron-doped diamond semiconductor
#293Method for producing a semiconductor layer
#294METHOD FOR PRODUCING A SEMICONDUCTOR
#295Substrate processing with reduced warpage and/or controlled strain
#296Compound semiconductor substrate and control for electrical property thereof
#297Semiconductor device and method of producing the same
#298Semiconductor device and fabrication method
#299Semiconductor device and method of producing the same
#300Method of producing an asymmetric architecture semi-conductor device