Assignee profile:

Tessera LLC

City:

San Jose, California

Country:

United States

Published Applications:

38

Last publication date:

2024-07-04

Patent Grants:

38

Last grant date:

2024-08-27

Top Inventors for applications by Tessera LLC

These are the the leading inventors for applications assigned to Tessera LLC:

Recent patent applications by Tessera LLC

Tessera LLC based in San Jose, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2024-07-04 ✅ Patent 12,074,165 granted on 2024-08-27
US20240222373A1
Electricity

Gate cut with integrated etch stop layer

#2 | 2024-05-02 ✅ Patent 12,033,892 granted on 2024-07-09
US20240145299A1
Electricity

Structure and method to improve FAV RIE process margin and electromigration

#3 | 2024-03-21 ✅ Patent 12,106,963 granted on 2024-10-01
US20240096627A1
Electricity

Self aligned pattern formation post spacer etchback in tight pitch configurations

#4 | 2024-03-07 ✅ Patent 11,978,639 granted on 2024-05-07
US20240079247A1
Electricity

Two-color self-aligned double patterning (SADP) to yield static random access memory (SRAM) and dense logic

#5 | 2023-09-07 ✅ Patent 11,776,957 granted on 2023-10-03
US20230282641A1
Electricity

Gate cut with integrated etch stop layer

#6 | 2022-11-24 ✅ Patent 11,830,845 granted on 2023-11-28
US20220375891A1
Electricity

Package-on-package assembly with wire bonds to encapsulation surface

#7 | 2022-11-03 ✅ Patent 11,929,286 granted on 2024-03-12
US20220352376A1
Electricity

Two dimension material fin sidewall

#8 | 2022-06-09 ✅ Patent 11,837,501 granted on 2023-12-05
US20220181205A1
Electricity

Selective recessing to form a fully aligned via

#9 | 2022-05-26 ✅ Patent 11,881,433 granted on 2024-01-23
US20220165620A1
Electricity

Advanced copper interconnects with hybrid microstructure

#10 | 2022-05-19 ✅ Patent 11,798,852 granted on 2023-10-24
US20220157666A1
Electricity

Hybrid-channel nano-sheet FETs

#11 | 2022-04-14 ✅ Patent 11,804,405 granted on 2023-10-31
US20220115269A1
Electricity

Method of forming copper interconnect structure with manganese barrier layer

#12 | 2022-01-13 ✅ Patent 11,615,988 granted on 2023-03-28
US20220013413A1
Electricity

FinFET devices

#13 | 2021-12-23 ✅ Patent 11,682,715 granted on 2023-06-20
US20210399114A1
Electricity

Forming nanosheet transistor using sacrificial spacer and inner spacers

#14 | 2021-11-04 ✅ Patent 11,699,591 granted on 2023-07-11
US20210343536A1
Electricity

Two-color self-aligned double patterning (SADP) to yield static random access memory (SRAM) and dense logic

#15 | 2021-10-28 ✅ Patent 11,574,864 granted on 2023-02-07
US20210335706A1
Electricity

Semiconductor device including a porous dielectric layer, and method of forming the semiconductor device

#16 | 2021-10-28 ✅ Patent 11,610,780 granted on 2023-03-21
US20210335619A1
Electricity

Alternating hardmasks for tight-pitch line formation

#17 | 2021-09-30 ✅ Patent 11,652,161 granted on 2023-05-16
US20210305405A1
Electricity

Nanosheet channel-to-source and drain isolation

#18 | 2021-09-30 ✅ Patent 11,552,077 granted on 2023-01-10
US20210305247A1
Electricity

Gate cut with integrated etch stop layer

#19 | 2021-09-09 ✅ Patent 11,670,510 granted on 2023-06-06
US20210280422A1
Electricity

Self aligned pattern formation post spacer etchback in tight pitch configurations

#20 | 2021-09-02 ✅ Patent 11,574,844 granted on 2023-02-07
US20210272854A1
Electricity

Fabrication of a vertical fin field effect transistor with reduced dimensional variations

#21 | 2021-07-15 ✅ Patent 11,676,854 granted on 2023-06-13
US20210217653A1
Electricity

Selective ILD deposition for fully aligned via with airgap

#22 | 2021-07-08 ✅ Patent 11,522,045 granted on 2022-12-06
US20210210596A1
Electricity

Semiconductor structures including middle-of-line (MOL) capacitance reduction for self-aligned contact in gate stack

#23 | 2021-07-08 ✅ Patent 11,710,658 granted on 2023-07-25
US20210210380A1
Electricity

Structure and method to improve FAV RIE process margin and Electromigration

#24 | 2021-07-01 ✅ Patent 11,380,583 granted on 2022-07-05
US20210202313A1
Electricity

Forming self-aligned vias and air-gaps in semiconductor fabrication

#25 | 2021-06-17 ✅ Patent 11,664,375 granted on 2023-05-30
US20210183856A1
Electricity

Minimizing shorting between FinFET epitaxial regions

#26 | 2021-06-17 ✅ Patent 11,488,862 granted on 2022-11-01
US20210183699A1
Electricity

Semiconductor device with reduced via resistance

#27 | 2021-04-15 ✅ Patent 11,581,190 granted on 2023-02-14
US20210111032A1
Electricity

Method of fabricating semiconductor fins by differentially oxidizing mandrel sidewalls

#28 | 2021-02-18 ✅ Patent 11,424,211 granted on 2022-08-23
US20210050322A1
Electricity

Package-on-package assembly with wire bonds to encapsulation surface

#29 | 2021-02-11 ✅ Patent 12,087,685 granted on 2024-09-10
US20210043563A1
Electricity

Semiconductor interconnect structure with double conductors

#30 | 2021-01-28 ✅ Patent 12,062,703 granted on 2024-08-13
US20210028287A1
Electricity

Self aligned replacement metal source/drain FINFET

#31 | 2020-12-24 ✅ Patent 11,587,830 granted on 2023-02-21
US20200402849A1
Electricity

Self-forming barrier for use in air gap formation

#32 | 2020-11-05 ✅ Patent 11,538,720 granted on 2022-12-27
US20200350211A1
Electricity

Stacked transistors with different channel widths

#33 | 2020-08-13 ✅ Patent 11,404,560 granted on 2022-08-02
US20200259002A1
Electricity

Punch through stopper in bulk finFET device

#34 | 2020-07-23 ✅ Patent 11,557,589 granted on 2023-01-17
US20200235094A1
Electricity

Air gap spacer for metal gates

#35 | 2020-07-09 ✅ Patent 11,424,365 granted on 2022-08-23
US20200219873A1
Electricity

Two dimension material fin sidewall

#36 | 2020-02-20 ✅ Patent 11,380,589 granted on 2022-07-05
US20200058554A1
Electricity

Selective removal of semiconductor fins

#37 | 2019-10-10 ✅ Patent 11,456,354 granted on 2022-09-27
US20190312104A1
Electricity

Bulk nanosheet with dielectric isolation

#38 | 2019-08-29 ✅ Patent 11,658,062 granted on 2023-05-23
US20190267279A1
Electricity

Air gap spacer formation for nano-scale semiconductor devices

Also check out TESSERA LLC's (San Jose, United States) applicant profile with 42 patent applications submitted.

AssigneeID:

351705 ⎘